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Optimal burn-in procedure for mixed populations based on the device degradation process history

Title
Optimal burn-in procedure for mixed populations based on the device degradation process history
Authors
Cha, Ji HwanPulcini, Gianpaolo
Ewha Authors
차지환
SCOPUS Author ID
차지환scopus
Issue Date
2016
Journal Title
EUROPEAN JOURNAL OF OPERATIONAL RESEARCH
ISSN
0377-2217JCR Link1872-6860JCR Link
Citation
vol. 251, no. 3, pp. 988 - 998
Keywords
Burn-inDegradation processNon-homogeneous gamma processMixed populationCost optimization
Publisher
ELSEVIER SCIENCE BV
Indexed
SCIE; SCOPUS WOS scopus
Abstract
Burn-in is a method of 'elimination' of initial failures (infant mortality). In the conventional burn-in procedures, to burn-in an item means to subject it to a fixed time period of simulated use prior to actual operation. Then, the items which failed during burn-in are just scrapped and only those which survived the burn-in procedure are considered to be of satisfactory quality. Thus, when the items are subject to degradation phenomena, those whose degradation levels at the end of burn-in exceed a given failure threshold level are eliminated. In this paper, we consider a new burn-in procedure for items subject to degradation phenomena and belonging to mixed populations composed of a weak and a strong subpopulation. The new procedure is based on the 'whole history' of the degradation process of an item periodically observed during the burn-in and utilizes the information contained in the observed degradation process to assess whether the item belongs to the strong or weak subpopulation. The problem of determining the optimal burn-in parameters is considered and the properties of the optimal parameters are derived. A numerical example is also provided to illustrate the theoretical results obtained in this paper. (C) 2015 Elsevier B.V. All rights reserved.
DOI
10.1016/j.ejor.2015.12.019
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자연과학대학 > 통계학전공 > Journal papers
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