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Scanning force microscopy of relaxor ferroelectric PbMg1/3Nb2/3O3-PbTiO3 thin films for piezoelectric sensors

Title
Scanning force microscopy of relaxor ferroelectric PbMg1/3Nb2/3O3-PbTiO3 thin films for piezoelectric sensors
Authors
Lee, J. H.Kim, T. Y.Oh, Y. J.Choi, M. R.Yoon, H. R.Jo, W.Nam, H. J.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2006
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
ISSN
0374-4884JCR Link
Citation
vol. 49, pp. S833 - S836
Keywords
relaxer ferroelectricPMN-PTpiezoelectricscanning force microscopy
Publisher
KOREAN PHYSICAL SOC
Indexed
SCI; SCIE; SCOPUS; KCI WOS
Abstract
Relaxor ferroelectric PbMg1/3Nb2/3O3-PbTiO3 (PMN-PT) thin films were grown by a sol-gel method. By using scanning force microscopy, piezoelectric poling and imaging were studied in a number of regions on the films with subsequent statistical analysis of the obtained data. Piezoresponse and poling behavior appear to have a relation with relaxor behavior of the materials, which is defined as frequency-dependent phase transition in ferroelectric materials. Hysteresis loops are observed when an external field is swept, regardless of vibration frequency of the bias, indicating relaxation behavior of the PMN-PT films.
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자연과학대학 > 물리학전공 > Journal papers
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