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Local observation of ferroelectric Bi3.25La0.75Ti3O12 thin films by atomic force microscopy

Title
Local observation of ferroelectric Bi3.25La0.75Ti3O12 thin films by atomic force microscopy
Authors
Kim, T. Y.Lee, J. H.Oh, Y. J.Choi, M. R.Yoon, H. R.Jo, W.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2006
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
ISSN
0374-4884JCR Link
Citation
vol. 49, pp. S595 - S599
Keywords
ferroelectricsol-geldomainatomic force microscopyannealing temperature(Bi,La)(4)Ti3O12
Publisher
KOREAN PHYSICAL SOC
Indexed
SCI; SCIE; SCOPUS; KCI WOS
Abstract
Ferroelectric M3.25La0.75Ti3O12 (BLT) thin films have been grown by a sol-gel method. Annealing conditions after the drying process have been explored over a wide range of temperature. Highly (001)- and (h00)-oriented BLT thin films are prepared on Pt/TiO2 coated SiO2/Si(100), depending on annealing temperature. Structural properties, surface morphology, and electrical properties are studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), and atomic electron microscopy (AEM), respectively. Ferroelectric domains in the thin films are observed by using AFM, registering the electrostatic force response of the thin films in the presence of a low ac field. It is found that the as-grown domain configuration and switching behavior are strongly dependent on crystal orientation, suggesting that annealing temperature is related to domain formation and its polarization-reversal dynamics.
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자연과학대학 > 물리학전공 > Journal papers
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