Showing results 5 to 6 of 6
Issue Date | Title | Author(s) | Type |
---|---|---|---|
2019 | Regularized Auto-Encoder-Based Separation of Defects from Backgrounds for Inspecting Display Devices | 김정태 | Article |
2023 | Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules | 김정태 | Article |