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Regularized Auto-Encoder-Based Separation of Defects from Backgrounds for Inspecting Display Devices

Title
Regularized Auto-Encoder-Based Separation of Defects from Backgrounds for Inspecting Display Devices
Authors
Jo, HeeyeonKim, Jeongtae
Ewha Authors
김정태
SCOPUS Author ID
김정태scopus
Issue Date
2019
Journal Title
ELECTRONICS
ISSN
2079-9292JCR Link
Citation
ELECTRONICS vol. 8, no. 5
Keywords
defect separationdefect inspectionmachine visiondeep learningobject detection
Publisher
MDPI
Indexed
SCIE; SCOPUS WOS
Document Type
Article
Abstract
We investigated a novel method for separating defects from the background for inspecting display devices. Separation of defects has important applications such as determining whether the detected defects are truly defective and the quantification of the degree of defectiveness. Although many studies on estimating patterned background have been conducted, the existing studies are mainly based on the approach of approximation by low-rank matrices. Because the conventional methods face problems such as imperfect reconstruction and difficulty of selecting the bases for low-rank approximation, we have studied a deep-learning-based foreground reconstruction method that is based on the auto-encoder structure with a regression layer for the output. In the experimental studies carried out using mobile display panels, the proposed method showed significantly improved performance compared to the existing singular value decomposition method. We believe that the proposed method could be useful not only for inspecting display devices but also for many applications that involve the detection of defects in the presence of a textured background.
DOI
10.3390/electronics8050533
Appears in Collections:
엘텍공과대학 > 전자공학과 > Journal papers
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