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A 46-nF/10-MΩ Range 114-aF/0.37-Ω Resolution Parasitic-and Temperature-Insensitive Reconfigurable RC-to-Digital Converter in 0.18-μm CMOS

Title
A 46-nF/10-MΩ Range 114-aF/0.37-Ω Resolution Parasitic-and Temperature-Insensitive Reconfigurable RC-to-Digital Converter in 0.18-μm CMOS
Authors
George A.K.Shim W.Kung J.Kim J.-H.Je M.Lee J.
Ewha Authors
김지훈
SCOPUS Author ID
김지훈scopus
Issue Date
2022
Journal Title
IEEE Transactions on Circuits and Systems I: Regular Papers
ISSN
1549-8328JCR Link
Citation
IEEE Transactions on Circuits and Systems I: Regular Papers vol. 69, no. 3, pp. 1171 - 1184
Keywords
CapacitanceCMOSDigital conversionParasiticcReconfigurableResistanceSensor interfacetemperature
Publisher
Institute of Electrical and Electronics Engineers Inc.
Indexed
SCIE; SCOPUS scopus
Document Type
Article
Abstract
This paper presents a 46 nF/10 M Ω-range, digital-intensive, reconfigurable RC-to-digital converter (R2CDC) that can readout multiple C and R sensors in a time-interleaved fashion. Ratio-metric conversion using swing-boosted period-modulation (SB-PM) front-end by the R2CDC results in 114 aFrms/0.37 Ω rms resolutions and a worst-case temperature-drift of 64.2 ppm/°C over-40 to 125°C. Femto-farad capacitances can be sensed with a relative code-deviation less than 0.16 % even when parasitics vary 30 times the baseline. Implemented in a 0.18 μ m standard CMOS process, the R2CDC consumes 140 μ A from a 1 V supply, occupying an active area of 0.175 μm 2. © 2004-2012 IEEE.
DOI
10.1109/TCSI.2021.3134010
Appears in Collections:
공과대학 > 전자전기공학전공 > Journal papers
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