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Organic Field-Effect Transistors with Bottlebrush Polymer Gate Dielectrics Thermally Cross-Linked in Less Than 1 min

Title
Organic Field-Effect Transistors with Bottlebrush Polymer Gate Dielectrics Thermally Cross-Linked in Less Than 1 min
Authors
Yang, Heesoo; Kim, Myung-Jin; Kang, Beom-Goo; Lee, Byoung Hoon
Ewha Authors
이병훈
SCOPUS Author ID
이병훈scopus
Issue Date
2021
Journal Title
CHEMISTRY OF MATERIALS
ISSN
0897-4756JCR Link

1520-5002JCR Link
Citation
CHEMISTRY OF MATERIALS vol. 33, no. 16, pp. 6356 - 6364
Publisher
AMER CHEMICAL SOC
Indexed
SCIE; SCOPUS WOS scopus
Document Type
Article
Abstract
We report high-performance and air-stable organic field-effect transistors (OFETs) fabricated with thermally cross-linked bottlebrush polymers as gate dielectrics. By synthesizing bottlebrush polymers with a varying degree of polymerization, we investigate the effect of the density of alkyne functional groups on the on-set cross-linking time (t(c)) and dielectric properties of the bottlebrush polymer thin films. The bottlebrush polymer with the highest density of alkyne groups shows the lowest t(c) of 0.6 min, and t(c) values increase to 0.8, 1, and 30 min as the density of alkyne groups decreases. These t(c) values are unambiguously shorter than that (t(c) > 120 min) of the most widely used polymer gate dielectric, poly(methyl methacrylate) (PMMA). The top-gate/bottom-contact OFET fabricated with poly{[N,N'-bis(2-octyldodecyl)-naphthalene-1,4,5,8-bis(dicarboximide)-2,6-diyl]-alt-5,5'-(2,2'-bithiophene)} and the bottlebrush polymer gate dielectric cross-linked in 1 min shows the highest charge carrier mobility (mu = 0.16 cm(2) V-1 s(-1)) and extended device lifetime (120 h) compared to those of OFETs fabricated with the other bottlebrush polymers and PMMA gate dielectrics. Considering the sufficiently reduced t(c) (<= 1 min) and excellent device properties of bottlebrush polymers, these results demonstrate that thermally cross-linkable bottlebrush polymers without any cross-linking agents would be promising materials for developing high-performance and reliable OFETs fabricated by a high-throughput fabrication method.
DOI
10.1021/acs.chemmater.1c01357
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공과대학 > 화공신소재공학과 > Journal papers
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