Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박수현 | * |
dc.date.accessioned | 2021-08-05T16:31:27Z | - |
dc.date.available | 2021-08-05T16:31:27Z | - |
dc.date.issued | 2021 | * |
dc.identifier.issn | 0169-4332 | * |
dc.identifier.other | OAK-29582 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/258558 | - |
dc.description.abstract | Thermal stealth and camouflage have been intensively studied for blending objects with their surroundings against remote thermal image detection. Adaptive control of infrared emissivity has been explored extensively as a promising way of thermal stealth, but it still requires an additional feedback control. Passive modulation of emissivity, however, has been remained as a great challenge which requires a precise engineering of emissivity over wide temperature range. Here, we report a drastic improvement of passive camouflage thin films capable of concealing thermal objects at near room temperature without any feedback control, which consists of a vanadium dioxide (VO2) layer with gradient tungsten (W) concentration. The gradient W-doping widens the metal-insulator transition width, accomplishing self-adaptive thermal stealth with a smooth change of emissivity. Our simple approach, applicable to other similar thermal camouflage materials for improving their passive cloaking, will find wide applications, such as passive thermal camouflage, urban energy-saving smart windows, and improved infrared sensors. © 2021 Elsevier B.V. | * |
dc.language | English | * |
dc.publisher | Elsevier B.V. | * |
dc.subject | Infrared emission | * |
dc.subject | Metal-insulator transition (MIT) | * |
dc.subject | Thermal stealth | * |
dc.subject | Transmission electron microscopy (TEM) | * |
dc.subject | Vanadium dioxide (VO2) | * |
dc.title | Enhanced passive thermal stealth properties of VO2 thin films via gradient W doping | * |
dc.type | Article | * |
dc.relation.volume | 561 | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.journaltitle | Applied Surface Science | * |
dc.identifier.doi | 10.1016/j.apsusc.2021.150056 | * |
dc.identifier.wosid | WOS:000663733200007 | * |
dc.identifier.scopusid | 2-s2.0-85105855149 | * |
dc.author.google | Kim H.J. | * |
dc.author.google | Choi Y.H. | * |
dc.author.google | Lee D. | * |
dc.author.google | Lee I.H. | * |
dc.author.google | Choi B.K. | * |
dc.author.google | Phark S.-H. | * |
dc.author.google | Chang Y.J. | * |
dc.contributor.scopusid | 박수현(6506497024) | * |
dc.date.modifydate | 20231123100450 | * |