AFM image visualization of layered dichalcogenides, 1T-MTe2(M = V, Ta)

Abstract

The surface structures of the layered chalcogenide VTe2, TaTe2 were probed by atomic force microscopy (AFM). The observed AFM images at the atomic level were analyzed by calculating the total electron density maps. The title compounds adopt double zigzag CDWs (Charge Density Waves) resulting in three unique tellurides. Thus, the brightness of the AFM image on the corrugated surface decreases in the order of Te(3) > Te(1) ≫ Te(2), Also, metal in the VTe2 system is more localized than that of TaTe2. © 1997 Elsevier Science Ltd. All rights reserved.