Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 최병주 | * |
dc.date.accessioned | 2016-08-29T12:08:02Z | - |
dc.date.available | 2016-08-29T12:08:02Z | - |
dc.date.issued | 2016 | * |
dc.identifier.issn | 1745-1361 | * |
dc.identifier.other | OAK-19000 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/231709 | - |
dc.description.abstract | The goal of software testing should go beyond simply finding defects. Ultimately, testing should be focused on increasing customer satisfaction. Defects that are detected in areas of the software that the customers are especially interested in can cause more customer dissatisfaction. If these defects accumulate, they can cause the software to be shunned in the marketplace. Therefore, it is important to focus on reducing defects in areas that customers consider valuable. This article proposes a value-driven V-model (V-2 model) that deals with customer values and reflects them in the test design for increasing customer satisfaction and raising test efficiency. | * |
dc.language | English | * |
dc.publisher | IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG | * |
dc.subject | V-model | * |
dc.subject | test design | * |
dc.subject | value-based software engineering | * |
dc.subject | customer value | * |
dc.subject | customer satisfaction | * |
dc.title | Value-Driven V-Model: From Requirements Analysis to Acceptance Testing | * |
dc.type | Article | * |
dc.relation.issue | 7 | * |
dc.relation.volume | E99D | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 1776 | * |
dc.relation.lastpage | 1785 | * |
dc.relation.journaltitle | IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS | * |
dc.identifier.doi | 10.1587/transinf.2015EDP7451 | * |
dc.identifier.wosid | WOS:000381562700005 | * |
dc.identifier.scopusid | 2-s2.0-84976876663 | * |
dc.author.google | Han, Youngsub | * |
dc.author.google | Lee, Dong-hyun | * |
dc.author.google | Choi, Byoungju | * |
dc.author.google | Hinchey, Mike | * |
dc.author.google | In, Hoh Peter | * |
dc.contributor.scopusid | 최병주(7402755545) | * |
dc.date.modifydate | 20240322133149 | * |