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dc.contributor.author한소엽-
dc.contributor.author한인식-
dc.date.accessioned2016-08-28T11:08:20Z-
dc.date.available2016-08-28T11:08:20Z-
dc.date.issued2015-
dc.identifier.issn0374-4884-
dc.identifier.otherOAK-12326-
dc.identifier.urihttp://dspace.ewha.ac.kr/handle/2015.oak/228502-
dc.description.abstractDamage to bulk; Non-ionizing energy loss; Si Mini-Pad; W/Si pre-shower-
dc.languageEnglish-
dc.publisherKorean Physical Society-
dc.titleEffects of damage caused by non-ionizing energy loss in Si Mini-Pad sensors for the PHENIX MPC-EX-
dc.typeArticle-
dc.relation.issue11-
dc.relation.volume65-
dc.relation.indexSCI-
dc.relation.indexSCIE-
dc.relation.indexSCOPUS-
dc.relation.indexKCI-
dc.relation.startpage1809-
dc.relation.lastpage1816-
dc.relation.journaltitleJournal of the Korean Physical Society-
dc.identifier.doi10.3938/jkps.65.1809-
dc.identifier.wosidWOS:000347455500011-
dc.identifier.scopusid2-s2.0-84920621473-
dc.author.googleChai J.-S.-
dc.author.googleGhergherehchi M.-
dc.author.googleHahn K.I.-
dc.author.googleHan S.Y.-
dc.author.googleJeong I.W.-
dc.author.googleJoo K.S.-
dc.author.googleKim E.J.-
dc.author.googleKim S.G.-
dc.author.googleKim Y.K.-
dc.author.googleKistenev E.-
dc.author.googleKwon Y.-
dc.author.googleLajoie J.G.-
dc.author.googleLi Z.-
dc.author.googleLee J.H.-
dc.author.googleLim K.S.-
dc.author.googleLim S.H.-
dc.author.googlePark J.M.-
dc.author.googlePark K.S.-
dc.author.googlePark S.Y.-
dc.author.googleSong H.S.-
dc.author.googleSue D.G.-
dc.author.googleSukhanov A.-
dc.contributor.scopusid한소엽(7405944194)-
dc.contributor.scopusid한인식(7201832280)-
dc.date.modifydate20200928105840-
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자연과학대학 > 화학·나노과학전공 > Journal papers
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