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dc.contributor.author신형순*
dc.date.accessioned2016-08-28T11:08:15Z-
dc.date.available2016-08-28T11:08:15Z-
dc.date.issued2014*
dc.identifier.issn1598-1657*
dc.identifier.otherOAK-12233*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/228442-
dc.description.abstractElectron mobility; Intervalley phonon mobility; Intravalley phonon mobility; Strain; Stress; Wafer orientation*
dc.languageEnglish*
dc.publisherInstitute of Electronics Engineers of Korea*
dc.titleSubstrate doping concentration dependence of electron mobility enhancement in uniaxial strained (110)/<110> nMOSFETs*
dc.typeArticle*
dc.relation.issue5*
dc.relation.volume14*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.indexKCI*
dc.relation.startpage518*
dc.relation.lastpage524*
dc.relation.journaltitleJournal of Semiconductor Technology and Science*
dc.identifier.doi10.5573/JSTS.2014.14.5.518*
dc.identifier.wosidWOS:000346137400004*
dc.identifier.scopusid2-s2.0-84908317401*
dc.author.googleSun W.*
dc.author.googleChoi S.*
dc.author.googleShin H.*
dc.contributor.scopusid신형순(7404012125)*
dc.date.modifydate20240322125227*
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공과대학 > 전자전기공학전공 > Journal papers
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