DSpace at EWHA: Software generated device exception for more intensive device-related software testing: An industrial field study

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Software generated device exception for more intensive device-related software testing: An industrial field study

Title: Software generated device exception for more intensive device-related software testing: An industrial field study

Authors: Seo J.; Choi B.; Lee S.

Ewha Authors: 최병주; 서주영

SCOPUS Author ID: 최병주; 서주영

Issue Date: 2013

Journal Title: Journal of Systems and Software

ISSN: 0164-1212

Citation: Journal of Systems and Software vol. 86, no. 12, pp. 3193 - 3212

Indexed: SCIE; SCOPUS

Document Type: Article

Abstract: Device exception; Device manager hacking; Embedded software; Exception test; Fault-injection method

DOI: 10.1016/j.jss.2013.07.058

Appears in Collections:: 인공지능대학 > 컴퓨터공학과 > Journal papers

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