2020 | A Dual-feedback Folded-cascode Fully Differential Transimpedance Amplifier in 65-nm CMOS | 박성민 | Article |
2020 | Hemispherical Microelectrode Array for Ex Vivo Retinal Neural Recording | 전상범 | Article |
2020 | Deep Video Prediction Network-ased Inter-Frame Coding in HEVC | 강제원 | Article |
2020 | Optimization Considerations for Short Channel Poly-Si 1T-DRAM | 신형순; 선우경 | Article |
2020 | Joint Viterbi detection and decoding algorithm for bluetooth low energy systems | 김지훈 | Article |
- | Non-iterative Coordinated Beamforming for Multicell MIMO Heterogeneous Networks | 박형곤 | Article; Early Access |
2020 | Effect of Initial Synaptic State on Pattern Classification Accuracy of 3D Vertical Resistive Random Access Memory (VRRAM) Synapses | 신형순; 선우경 | Article |
2020 | Analysis of Organic Light-Emitting Diode SPICE Models with Constant or Voltage-Dependent Components | 신형순; 박지선 | Article |
2020 | Complementary Metal-Oxide-Semiconductor Symmetric Current-Conveyor Transimpedance Amplifier | 박성민; 김지훈 | Article |
2020 | Charge Based Current-Voltage Model for the Silicon on Insulator Junctionless Field-Effect Transistor | 신형순; 박지선 | Article |
2020 | A CMOS Read-Out IC for Cyanobacteria Detection With 40 nA(pp) Sensitivity and 45-dB Dynamic Range | 박성민; 김지훈 | Article |
2019 | Context-Based Ternary Tree Decision Method in Versatile Video Coding for Fast Intra Coding | 강제원 | Article |
2020 | Bootstrapped Fully Differential CMOS Transimpedance Amplifier | 박성민; 김지훈 | Article |
2020 | Analysis of the Sensing Margin of Silicon and Poly-Si 1T-DRAM | 신형순; 선우경 | Article |
2020 | Color image enhancement with high saturation using piecewise linear gamut mapping | 이병욱 | Article |
2020 | Intelligent IoT Connectivity: Deep Reinforcement Learning Approach | 박형곤 | Article |
2020 | Reliability Analysis of an Epileptic Seizure Detector Powered by an Energy Harvester | 지창현 | Article |
2020 | Dual-load Bloom filter: Application for name lookup | 임혜숙 | Article |
2020 | A switchable dual-mode fully-differential common-source low-noise amplifier in 0.18-mu m CMOS technology | 박성민 | Article |
2020 | Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal Regions | 김정태 | Article |