Browsing bySubjectflexible thin-film transistor (TFT)

Jump to:
All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
  • Sort by:
  • In order:
  • Results/Page
  • Authors/Record:

Showing results 1 to 1 of 1

Issue DateTitleAuthor(s)Type
2021New Simulation Method for Dependency of Device Degradation on Bending Direction and Channel Length신형순; 박지선Article

BROWSE