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dc.contributor.author최병주*
dc.contributor.author박지현*
dc.date.accessioned2023-12-18T16:31:28Z-
dc.date.available2023-12-18T16:31:28Z-
dc.date.issued2023*
dc.identifier.issn2079-9292*
dc.identifier.otherOAK-33967*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/266624-
dc.description.abstractIn software development, early defect detection using static analysis can be performed without executing the source code. However, defects are detected on a non-execution basis, thus resulting in a higher ratio of false positives. Recently, studies have been conducted to effectively perform static analyses using machine learning (ML) and deep learning (DL) technologies. This study examines the techniques for detecting runtime errors used in existing static analysis tools and the causes and rates of false positives. It analyzes the latest static analysis technologies that apply machine learning/deep learning to decrease false positives and compares them with existing technologies in terms of effectiveness and performance. In addition, machine-learning/deep-learning-based defect detection techniques were implemented in experimental environments and real-world software to determine their effectiveness in real-world software. © 2023 by the authors.*
dc.languageEnglish*
dc.publisherMultidisciplinary Digital Publishing Institute (MDPI)*
dc.subjectdeep learning*
dc.subjectearly defect detection*
dc.subjectfalse positive rate*
dc.subjectmachine learning*
dc.subjectstatic analysis*
dc.titleReduction of False Positives for Runtime Errors in C/C++ Software: A Comparative Study*
dc.typeArticle*
dc.relation.issue16*
dc.relation.volume12*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.journaltitleElectronics (Switzerland)*
dc.identifier.doi10.3390/electronics12163518*
dc.identifier.wosidWOS:001055778500001*
dc.identifier.scopusid2-s2.0-85169125431*
dc.author.googlePark J.*
dc.author.googleShin J.*
dc.author.googleChoi B.*
dc.contributor.scopusid최병주(7402755545)*
dc.contributor.scopusid박지현(55316619700)*
dc.date.modifydate20240322133149*
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인공지능대학 > 컴퓨터공학과 > Journal papers
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