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Proximity Engineering of the van der Waals Interaction in Multilayered Graphene

Title
Proximity Engineering of the van der Waals Interaction in Multilayered Graphene
Authors
Kim, SeraPark, JonghoDinh Loc DuongCho, SuyeonKim, Sung WngYang, Heejun
Ewha Authors
조수연
SCOPUS Author ID
조수연scopus
Issue Date
2019
Journal Title
ACS APPLIED MATERIALS & INTERFACES
ISSN
1944-8244JCR Link

1944-8252JCR Link
Citation
ACS APPLIED MATERIALS & INTERFACES vol. 11, no. 45, pp. 42528 - 42533
Keywords
proximity engineeringvan der Waals interactionmultilayered graphenecontact resistanceelectride
Publisher
AMER CHEMICAL SOC
Indexed
SCIE; SCOPUS WOS
Document Type
Article
Abstract
The van der Waals (vdW) interaction in two-dimensional (2D)-layered materials affects key characteristics of electronic devices, such as the contact resistance, with a vertical heterostructure geometry. While various functionalizations to manipulate the properties of 2D materials have shown issues such as defect generation or have a limited spatial range for the methods, engineering the vdW interaction in nondestructive ways for device applications has not been tried or properly achieved yet. Here, we introduce the proximity engineering of the vdW interaction in multilayered graphene, which is observed as modified interlayer distances and deviated stacking orders by Raman spectroscopy. A 2D electride, [Ca2N](+)center dot e(-), possessing a low-work function of 2.6 eV, was used to trigger an avalanche of electrons over tens of graphene layers, exceeding the conventional spatial-range limit (similar to 1 nm) by screening with a carrier density of 10(14) cm(-2). Our proximity engineering reduces the vdW interaction in a nondestructive way and achieves a promising graphene-metal contact resistance of 500 Omega.mu m without using complicated edge contacts, which demonstrates a way to use moderately decoupled graphene layers for device applications.
DOI
10.1021/acsami.9b16655
Appears in Collections:
공과대학 > 화공신소재공학과 > Journal papers
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