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Ensemble of binary tree structured deep convolutional network for image classification

Title
Ensemble of binary tree structured deep convolutional network for image classification
Authors
Lee J.-E.Kang M.-J.Kang J.-W.
Ewha Authors
강제원
SCOPUS Author ID
강제원scopus
Issue Date
2018
Journal Title
Proceedings - 9th Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA ASC 2017
Citation
Proceedings - 9th Asia-Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA ASC 2017 vol. 2018-February, pp. 1448 - 1451
Publisher
Institute of Electrical and Electronics Engineers Inc.
Indexed
SCOPUS scopus
Document Type
Conference Paper
Abstract
In this paper, we propose an ensemble of tree- structured learning architecture to improve the discriminative capability of deep convolutional neural network (DCNN) for image classification. In the proposed technique, the path from the root node to a leaf node represents a classification rule. Thus, to maximize the classification accuracy, each internal node needs to make an optimal binary decision to the left or the right child node. To this aim, we develop a tree-CNN as a randomized tree to embed a DCNN into each internal node and train the model to determine the best traversing path to predict a class. Classification of some images with similar statistical properties yet belonging to different classes are difficult with the conventional DCNN architecture. Thus, to resolve the problem, we use a coarse-to-fine approach where subsequent networks in children nodes are hierarchically and randomly organized to discriminate smaller sets of classes than those in a parent node. The results from all the individual tree-CNNs are ensembled to make the final decision in classification. The proposed technique is implemented with the state-of-the-art deep network model, i.e., Wide Residual Network DCNN model [19], and is demonstrated with experimental results to outperform the classification performance over the anchor. © 2017 IEEE.
DOI
10.1109/APSIPA.2017.8282260
ISBN
9781538615423
Appears in Collections:
공과대학 > 전자전기공학전공 > Journal papers
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