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dc.contributor.author신형순-
dc.date.accessioned2018-06-02T08:15:17Z-
dc.date.available2018-06-02T08:15:17Z-
dc.date.issued1996-
dc.identifier.issn0013-5194-
dc.identifier.otherOAK-16955-
dc.identifier.urihttp://dspace.ewha.ac.kr/handle/2015.oak/244466-
dc.description.abstractA model for the α-particle-induced charge collection has been developed. By accounting for the funnelling and diffusion charges separately, our model accurately describes the junction size dependence of collected charge for a wide range of junction sizes, substrate doping levels, and α-particle energies.-
dc.languageEnglish-
dc.titleUnified model for junction size, substrate doping, and energy dependence of α-particle-induced charge collection-
dc.typeArticle-
dc.relation.issue20-
dc.relation.volume32-
dc.relation.indexSCI-
dc.relation.indexSCIE-
dc.relation.indexSCOPUS-
dc.relation.startpage1880-
dc.relation.lastpage1882-
dc.relation.journaltitleElectronics Letters-
dc.identifier.scopusid2-s2.0-0030234968-
dc.author.googleShin H.-
dc.contributor.scopusid신형순(7404012125)-
dc.date.modifydate20180601095454-
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엘텍공과대학 > 전자공학과 > Journal papers
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