Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 최병주 | * |
dc.date.accessioned | 2018-06-02T08:14:42Z | - |
dc.date.available | 2018-06-02T08:14:42Z | - |
dc.date.issued | 2003 | * |
dc.identifier.issn | 0003-018X | * |
dc.identifier.other | OAK-17350 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/244241 | - |
dc.description.abstract | [No abstract available] | * |
dc.language | English | * |
dc.title | Software Testing Techniques for Safety-Critical Embedded Software | * |
dc.type | Conference Paper | * |
dc.relation.volume | 89 | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 197 | * |
dc.relation.journaltitle | Transactions of the American Nuclear Society | * |
dc.identifier.scopusid | 2-s2.0-0346274039 | * |
dc.author.google | Sung A.Y. | * |
dc.author.google | Choi B.J. | * |
dc.contributor.scopusid | 최병주(7402755545) | * |
dc.date.modifydate | 20240322133149 | * |