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Band Alignment at Au/MoS2 Contacts: Thickness Dependence of Exfoliated Flakes

Title
Band Alignment at Au/MoS2 Contacts: Thickness Dependence of Exfoliated Flakes
Authors
Sohn A.Moon H.Kim J.Seo M.Min K.-A.Lee S.W.Yoon S.Hong S.Kim D.-W.
Ewha Authors
윤석현김동욱이상욱
SCOPUS Author ID
윤석현scopus; 김동욱scopus; 이상욱scopus
Issue Date
2017
Journal Title
Journal of Physical Chemistry C
ISSN
1932-7447JCR Link
Citation
vol. 121, no. 40, pp. 22517 - 22522
Publisher
American Chemical Society
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
We investigated the surface potential (Vsurf) of exfoliated MoS2 flakes on bare and Au-coated SiO2/Si substrates using Kelvin probe force microscopy. The Vsurf of MoS2 single layers was larger on the Au-coated substrates than on the bare substrates; our theoretical calculations indicate that this may be caused by the formation of a larger electric dipole at the MoS2/Au interface leading to a modified band alignment. Vsurf decreased as the thickness of the flakes increased until reaching the bulk value at a thickness of a20 nm (a30 layers) on the bare and a80 nm (a120 layers) on the Au-coated substrates, respectively. This thickness dependence of Vsurf was attributed to electrostatic screening in the MoS2 layers. Thus, a difference in the thickness at which the bulk Vsurf appeared suggests that the underlying substrate has an effect on the electric-field screening length of the MoS2 flakes. This work provides important insights to help understand and control the electrical properties of metal/MoS2 contacts. © 2017 American Chemical Society.
DOI
10.1021/acs.jpcc.7b07511
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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