Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 차지환 | * |
dc.date.accessioned | 2017-08-25T05:08:35Z | - |
dc.date.available | 2017-08-25T05:08:35Z | - |
dc.date.issued | 2017 | * |
dc.identifier.issn | 0361-0926 | * |
dc.identifier.other | OAK-20416 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/235646 | - |
dc.description.abstract | In the reliability area, the concept of the residual lifetime of a non repairable system is very important and its property has been intensively studied. In this article, we define the “residual failure process” for a repairable system and study its stochastic properties thoroughly. The detailed discussions are given when the corresponding failure process is a renewal process. An illustrative example is also discussed. © 2017 Taylor & Francis Group, LLC. | * |
dc.language | English | * |
dc.publisher | Taylor and Francis Inc. | * |
dc.subject | Prediction | * |
dc.subject | Process history | * |
dc.subject | Renewal process | * |
dc.subject | Residual failure process | * |
dc.title | Prediction of the residual failure processes based on the process history | * |
dc.type | Article | * |
dc.relation.issue | 13 | * |
dc.relation.volume | 46 | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 6336 | * |
dc.relation.lastpage | 6357 | * |
dc.relation.journaltitle | Communications in Statistics - Theory and Methods | * |
dc.identifier.doi | 10.1080/03610926.2015.1122059 | * |
dc.identifier.wosid | WOS:000398151200009 | * |
dc.identifier.scopusid | 2-s2.0-85014567919 | * |
dc.author.google | Cha J.H. | * |
dc.author.google | Badía F.G. | * |
dc.contributor.scopusid | 차지환(7202455739) | * |
dc.date.modifydate | 20231123095848 | * |