View : 116 Download: 0

A New Method for Determining the Subgap Density of States in n-/p-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistors

Title
A New Method for Determining the Subgap Density of States in n-/p-Type Low-Temperature Polycrystalline-Silicon Thin-Film Transistors
Authors
Lee, InjaeKim, MiryeonShin, Min-HoShin, Hyungsoon
Ewha Authors
신형순
SCOPUS Author ID
신형순scopus
Issue Date
2017
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
ISSN
1533-4880JCR Link1533-4899JCR Link
Citation
vol. 17, no. 5, pp. 2951 - 2958
Keywords
Density of StatesLow-Temperature Polycrystalline-Silicon Thin-Film Transistors
Publisher
AMER SCIENTIFIC PUBLISHERS
Indexed
SCI; SCIE; SCOPUS WOS
Abstract
A new method for determining the acceptor-/donor-like density of states (DOS) over the entire bandgap using both the measured multi-frequency capacitance-voltage characteristics and the differential ideality factor in n-/p-type low-temperature polycrystalline-silicon thin-film transistors (LTPS TFTs) is proposed and verified. The density of deep states as a function of the gate voltage (V-gs) is obtained using the differential ideality factor, which is calculated from the transfer curves. The density of tail states as a function of V-gs is obtained using the subgap DOS-induced capacitance (C-LOC), which is calculated from the multi-frequency capacitance-voltage and resistance-voltage characteristics. The relationship between V-gs and energy, which is used to convert the DOS as a function of V-gs into the distribution of the DOS as a function of energy for device simulation, is defined using the frequency-independent gate capacitance (C-G), composed of the gate oxide capacitance (C-OX), C-LOC and the free-carrier charge induced capacitance (C-FREE). The device simulation results using the acceptor-/donor-like DOS obtained by the new method for n-/p-type LTPS TFTs exhibit excellent agreement with the measured data.
DOI
10.1166/jnn.2017.14028
Appears in Collections:
엘텍공과대학 > 전자공학과 > Journal papers
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE