Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 최병주 | * |
dc.date.accessioned | 2017-02-15T08:02:15Z | - |
dc.date.available | 2017-02-15T08:02:15Z | - |
dc.date.issued | 2007 | * |
dc.identifier.issn | 0920-5489 | * |
dc.identifier.other | OAK-3992 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/234322 | - |
dc.description.abstract | An embedded system has a hierarchical structure including hardware-dependent software layer, operating system layer, and applications layer. Since the system has interfaces between the different layers that are tightly coupled and inter-dependent to each other, these interfaces are the focal area to be tested. This paper proposes an Embedded System's Interface Test Model (EmITM) to test hardware interfaces and OS interfaces. The EmITM provides a set of test items based on the interfaces when testing embedded software. We apply our model to embedded software test and analyze the test results. © 2006 Elsevier B.V. All rights reserved. | * |
dc.language | English | * |
dc.title | An interface test model for hardware-dependent software and embedded OS API of the embedded system | * |
dc.type | Article | * |
dc.relation.issue | 4 | * |
dc.relation.volume | 29 | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 430 | * |
dc.relation.lastpage | 443 | * |
dc.relation.journaltitle | Computer Standards and Interfaces | * |
dc.identifier.doi | 10.1016/j.csi.2006.07.002 | * |
dc.identifier.wosid | WOS:000246292600003 | * |
dc.identifier.scopusid | 2-s2.0-33947714501 | * |
dc.author.google | Sung A. | * |
dc.author.google | Choi B. | * |
dc.author.google | Shin S. | * |
dc.contributor.scopusid | 최병주(7402755545) | * |
dc.date.modifydate | 20240322133149 | * |