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Electrode-dependent electrical properties of metal/Nb-doped SrTi O3 junctions

Title
Electrode-dependent electrical properties of metal/Nb-doped SrTi O3 junctions
Authors
Park C.Seo Y.Jung J.Kim D.-W.
Ewha Authors
김동욱
SCOPUS Author ID
김동욱scopus
Issue Date
2008
Journal Title
Journal of Applied Physics
ISSN
0021-8979JCR Link
Citation
vol. 103, no. 5
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
In this study, we discuss the electrical properties of junctions consisting of metal electrodes and Nb-doped SrTi O3 (001) single crystals. The junctions formed with large work function metals (Ni, Au, Pd, and Pt) resulted in rectifying transport. A hysteretic feature was observed in the current (I) -voltage (V) and capacitance (C) -V characteristics of these junctions upon polarity reversal. The ideal Schottky-Mott rule could not explain the barrier height obtained from the I-V data, indicating the existence of interface states. Analyses of the C-V data revealed that a low dielectric constant layer existed at the interface. The interface states and layers affected the transport and the related resistance switching characteristics of the junctions. © 2008 American Institute of Physics.
DOI
10.1063/1.2872707
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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