View : 19 Download: 0

Structural properties of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides

Title
Structural properties of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxides
Authors
Lee J.H.Choi M.R.Jo W.Jang J.Y.Kim M.Y.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2008
Journal Title
Ultramicroscopy
ISSN
0304-3991JCR Link
Citation
vol. 108, no. 10, pp. 1106 - 1109
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
Coating of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 (PMN-PT) relaxor ferroelectrics by a sol-gel method is followed by growth of epitaxial SrRuO3 (SRO) metallic oxide electrodes on SrTiO3 (STO) single-crystal substrate by pulsed laser deposition. High-quality PMN-PT films on SRO with preferred growth orientation were successfully fabricated by controlling the operation parameters. Structural properties of relaxor ferroelectric PMN-PT thin films on SRO/STO substrates have been studied by X-ray diffraction (XRD), transmission electron microscopy (TEM) and atomic force microscopy (AFM). In-plane and out-of-plane alignments of the heterostructure are confirmed and the structural twinning of the materials are also revealed. © 2008 Elsevier B.V. All rights reserved.
DOI
10.1016/j.ultramic.2008.04.020
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE