DSpace at EWHA: Memory leakage detection by PCB hooking in Android

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DC Field	Value	Language
dc.contributor.author	최병주	*
dc.date.accessioned	2016-08-29T12:08:33Z	-
dc.date.available	2016-08-29T12:08:33Z	-
dc.date.issued	2014	*
dc.identifier.issn	1343-4500	*
dc.identifier.other	OAK-18351	*
dc.identifier.uri	https://dspace.ewha.ac.kr/handle/2015.oak/231425	-
dc.description.abstract	Android; Memory leakage; Software test	*
dc.language	English	*
dc.publisher	International Information Institute Ltd.	*
dc.title	Memory leakage detection by PCB hooking in Android	*
dc.type	Article	*
dc.relation.issue	10A	*
dc.relation.volume	17	*
dc.relation.index	SCOPUS	*
dc.relation.startpage	4875	*
dc.relation.lastpage	4883	*
dc.relation.journaltitle	Information (Japan)	*
dc.identifier.scopusid	2-s2.0-84916611919	*
dc.author.google	Park J.	*
dc.author.google	Choi B.	*
dc.contributor.scopusid	최병주(7402755545)	*
dc.date.modifydate	20240322133149	*