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Memory leakage detection by PCB hooking in Android

Title
Memory leakage detection by PCB hooking in Android
Authors
Park J.Choi B.
Ewha Authors
최병주
SCOPUS Author ID
최병주scopus
Issue Date
2014
Journal Title
Information (Japan)
ISSN
1343-4500JCR Link
Citation
vol. 17, no. 10A, pp. 4875 - 4883
Publisher
International Information Institute Ltd.
Indexed
SCOPUS scopus
Abstract
Android; Memory leakage; Software test
Appears in Collections:
엘텍공과대학 > 컴퓨터공학과 > Journal papers
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