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dc.contributor.author조윌렴*
dc.date.accessioned2016-08-28T11:08:59Z-
dc.date.available2016-08-28T11:08:59Z-
dc.date.issued2012*
dc.identifier.isbn9781605114316*
dc.identifier.issn0272-9172*
dc.identifier.otherOAK-13883*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/229826-
dc.description.abstractWe report the microstructures and dielectric properties of Ca 1-xSrxCu3Ti4O12 (C 1-xSxCTO, 0≤x≤1) ceramics sintered at the various sintering temperatures ranging from 1000 to 1060°C in air. The linear increase in lattice parameter in C1-xSxCTO (0≤x≤1) ceramics is observable for the full range of substitution. However, the second phases of SrTiO3 and CuO start to occur from the composition of x=0.8, implying that a stoichiometric SrCu3Ti4O 12 (SCTO) compound may not exist. While the C0.6S 0.4CTO and C0.4S0.6CTiO samples exhibit relatively lower dielectric constant (εr) of ∼40,000 below 1 kHz, the CaCu3Ti4O12 (CCTO) and SCTO show the extremely high εr values of ∼120,000 and ∼180,000, respectively. Complex impedance (Z*) and modulus (M*) spectroscopy revealed that the capacitance (C) and resistivity (ρ) values of grain boundary in all samples are much higher than those of grains. © 2012 Materials Research Society.*
dc.languageEnglish*
dc.titleFabrication and characterization of colossal dielectric response of polycrystalline Ca1-xSrxCu3Ti4O 12 (0≤x≤1) ceramics*
dc.typeConference Paper*
dc.relation.volume1454*
dc.relation.indexSCOPUS*
dc.relation.startpage81*
dc.relation.lastpage87*
dc.relation.journaltitleMaterials Research Society Symposium Proceedings*
dc.identifier.doi10.1557/opl.2012.1071*
dc.identifier.scopusid2-s2.0-84870684054*
dc.author.googleLee S.Y.*
dc.author.googleYoo D.-K.*
dc.author.googleLee J.*
dc.author.googleJo W.*
dc.author.googleHong Y.-W.*
dc.author.googleKim Y.-H.*
dc.author.googleYoo S.-I.*
dc.contributor.scopusid조윌렴(7103322276)*
dc.date.modifydate20240123091004*
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