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Near infrared spectroscopic characterization of metamaterials fabricated by focused ion beam milling

Title
Near infrared spectroscopic characterization of metamaterials fabricated by focused ion beam milling
Authors
Kim J.Lee Y.U.Kang B.Woo J.H.Choi E.Kim E.S.Gwon M.Kim D.-W.Wu J.W.
Ewha Authors
우정원강보영
SCOPUS Author ID
우정원scopus
Issue Date
2012
Journal Title
Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012
Indexed
SCOPUS scopus
Abstract
Nano-scaled metamaterials are fabricated by a focused ion beam milling under the fine control of process factors. The meta-resonances are studied in NTR regime and they show the polarization-angle dependence coming from their meta-structures. © 2012 IEEE.
DOI
10.1109/OECC.2012.6276788
ISBN
9781467309776
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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