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An EFSM-based test generation for validation of SDL specifications

Title
An EFSM-based test generation for validation of SDL specifications
Authors
Wong W.E.Restrepo A.Qi Y.Choi B.
Ewha Authors
최병주
SCOPUS Author ID
최병주scopus
Issue Date
2008
Journal Title
Proceedings - International Conference on Software Engineering
ISSN
0270-5257JCR Link
Citation
pp. 25 - 32
Indexed
SCOPUS scopus
Abstract
Existing techniques for testing an SDL specification mainly allow for either black box simulation or conformance testing to verify that the behavior of an implementation matches its corresponding model. However, this relies on the potentially hazardous assumption that the model is completely correct. We propose a test generation framework that can accomplish conformance verification as well as coverage criteria-driven white box testing of the specification itself. This approach builds on earlier work which established how to translate SDL processes into standard EFSMs and identify "hot spots" - nodes or edges in the EFSM which should be prioritized during testing to effectively increase coverage. Our technique generates test sequences intended to cover selected hot spots; we address the possible infeasibility of such a test sequence by allowing for its rejection decided by a constraint solver and re-generation of an alternate test sequence to the hot spot. In this paper, we present our EFSM translation and test generation tool and provide a case study demonstrating the effectiveness of our coverage-based test sequence selection. Copyright 2008 ACM.
DOI
10.1145/1370042.1370049
ISBN
9781605580302
Appears in Collections:
엘텍공과대학 > 컴퓨터공학과 > Journal papers
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