Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김동욱 | * |
dc.date.accessioned | 2016-08-28T11:08:35Z | - |
dc.date.available | 2016-08-28T11:08:35Z | - |
dc.date.issued | 2014 | * |
dc.identifier.issn | 0042-207X | * |
dc.identifier.other | OAK-10967 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/227471 | - |
dc.description.abstract | Bias voltage and frequency; Bulk ZnO; Capacitance voltage measurements; Interface state density; Oxygen plasmas; Schottky contacts; Series resistances; Strong dependences; Electric resistance; Interface states; Oxygen; Plasma applications; Plasmas; Schottky barrier diodes; Zinc oxide; Electric properties | * |
dc.language | English | * |
dc.title | Effect of oxygen plasma treatment on the electrical properties in Ag/bulk ZnO Schottky diodes | * |
dc.type | Article | * |
dc.relation.volume | 101 | * |
dc.relation.index | SCI | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 92 | * |
dc.relation.lastpage | 97 | * |
dc.relation.journaltitle | Vacuum | * |
dc.identifier.doi | 10.1016/j.vacuum.2013.07.024 | * |
dc.identifier.wosid | WOS:000330143000017 | * |
dc.identifier.scopusid | 2-s2.0-84883160358 | * |
dc.author.google | Kim H. | * |
dc.author.google | Kim D.-W. | * |
dc.contributor.scopusid | 김동욱(57203350633) | * |
dc.date.modifydate | 20240123114549 | * |