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dc.contributor.author김동욱*
dc.date.accessioned2016-08-28T11:08:35Z-
dc.date.available2016-08-28T11:08:35Z-
dc.date.issued2014*
dc.identifier.issn0042-207X*
dc.identifier.otherOAK-10967*
dc.identifier.urihttps://dspace.ewha.ac.kr/handle/2015.oak/227471-
dc.description.abstractBias voltage and frequency; Bulk ZnO; Capacitance voltage measurements; Interface state density; Oxygen plasmas; Schottky contacts; Series resistances; Strong dependences; Electric resistance; Interface states; Oxygen; Plasma applications; Plasmas; Schottky barrier diodes; Zinc oxide; Electric properties*
dc.languageEnglish*
dc.titleEffect of oxygen plasma treatment on the electrical properties in Ag/bulk ZnO Schottky diodes*
dc.typeArticle*
dc.relation.volume101*
dc.relation.indexSCI*
dc.relation.indexSCIE*
dc.relation.indexSCOPUS*
dc.relation.startpage92*
dc.relation.lastpage97*
dc.relation.journaltitleVacuum*
dc.identifier.doi10.1016/j.vacuum.2013.07.024*
dc.identifier.wosidWOS:000330143000017*
dc.identifier.scopusid2-s2.0-84883160358*
dc.author.googleKim H.*
dc.author.googleKim D.-W.*
dc.contributor.scopusid김동욱(57203350633)*
dc.date.modifydate20240123114549*
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자연과학대학 > 물리학전공 > Journal papers
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