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Influence of oxygen annealing conditions on the electronic structure, dielectric function, and charge conduction of gallium-ferrite thin films

Title
Influence of oxygen annealing conditions on the electronic structure, dielectric function, and charge conduction of gallium-ferrite thin films
Authors
Shin R.H.Oh S.H.Lee J.H.Jo W.Jang S.Han M.Choi S.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2013
Journal Title
Journal of the Korean Physical Society
ISSN
0374-4884JCR Link
Citation
vol. 63, no. 11, pp. 2179 - 2184
Indexed
SCI; SCIE; SCOPUS; KCI WOS scopus
Abstract
Charge conduction; Dielectric function; Fe valence; Gallium ferrite; Oxygen vacancies
DOI
10.3938/jkps.63.2179
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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