Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 최병주 | * |
dc.contributor.author | 서주영 | * |
dc.date.accessioned | 2016-08-28T11:08:20Z | - |
dc.date.available | 2016-08-28T11:08:20Z | - |
dc.date.issued | 2013 | * |
dc.identifier.issn | 0164-1212 | * |
dc.identifier.other | OAK-10819 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/227337 | - |
dc.description.abstract | Device exception; Device manager hacking; Embedded software; Exception test; Fault-injection method | * |
dc.language | English | * |
dc.title | Software generated device exception for more intensive device-related software testing: An industrial field study | * |
dc.type | Article | * |
dc.relation.issue | 12 | * |
dc.relation.volume | 86 | * |
dc.relation.index | SCIE | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 3193 | * |
dc.relation.lastpage | 3212 | * |
dc.relation.journaltitle | Journal of Systems and Software | * |
dc.identifier.doi | 10.1016/j.jss.2013.07.058 | * |
dc.identifier.wosid | WOS:000328523300017 | * |
dc.identifier.scopusid | 2-s2.0-84887015859 | * |
dc.author.google | Seo J. | * |
dc.author.google | Choi B. | * |
dc.author.google | Lee S. | * |
dc.contributor.scopusid | 최병주(7402755545) | * |
dc.contributor.scopusid | 서주영(24460917800) | * |
dc.date.modifydate | 20240325112008 | * |