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Software generated device exception for more intensive device-related software testing: An industrial field study

Title
Software generated device exception for more intensive device-related software testing: An industrial field study
Authors
Seo J.Choi B.Lee S.
Ewha Authors
최병주서주영
SCOPUS Author ID
최병주scopus
Issue Date
2013
Journal Title
Journal of Systems and Software
ISSN
0164-1212JCR Link
Citation
vol. 86, no. 12, pp. 3193 - 3212
Indexed
SCIE; SCOPUS WOS scopus
Abstract
Device exception; Device manager hacking; Embedded software; Exception test; Fault-injection method
DOI
10.1016/j.jss.2013.07.058
Appears in Collections:
엘텍공과대학 > 컴퓨터공학과 > Journal papers
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