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Local current-voltage behaviors of preferentially and randomly textured Cu(In,Ga)Se 2 thin films investigated by conductive atomic force microscopy

Title
Local current-voltage behaviors of preferentially and randomly textured Cu(In,Ga)Se 2 thin films investigated by conductive atomic force microscopy
Authors
Shin R.H.Jo W.Kim D.-W.Yun J.H.Ahn S.
Ewha Authors
조윌렴김동욱
SCOPUS Author ID
조윌렴scopus; 김동욱scopus
Issue Date
2011
Journal Title
Applied Physics A: Materials Science and Processing
ISSN
0947-8396JCR Link
Citation
vol. 104, no. 4, pp. 1189 - 1194
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
Electrical transport properties on polycrystalline Cu(In,Ga)Se 2 (CIGS) (Ga/(In+Ga) ≈ 35%) thin films were examined by conductive atomic force microscopy. The CIGS thin films with a (112) preferential or random texture were deposited on Mo-coated glass substrates. Triangular pyramidal grain growths were observed in the CIGS thin films preferentially textured to the (112) planes. Current maps of the CIGS surface were acquired with a zero or nonzero external voltage bias. The contrast of the images on the grain boundaries and intragrains displayed the conduction path in the materials. Local current-voltage measurements were performed to evaluate the charge conduction properties of the CIGS thin films. © Springer-Verlag 2011.
DOI
10.1007/s00339-011-6408-y
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자연과학대학 > 물리학전공 > Journal papers
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