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Characterization of magnetoresistance hysteresis of Permalloy thin-film using near-field microwave microscope

Title
Characterization of magnetoresistance hysteresis of Permalloy thin-film using near-field microwave microscope
Authors
Melikyan H.Babajanyan A.Lee N.J.Kim T.H.Lee H.Lee K.Friedman B.
Ewha Authors
김태희
SCOPUS Author ID
김태희scopus
Issue Date
2010
Journal Title
Thin Solid Films
ISSN
0040-6090JCR Link
Citation
vol. 519, no. 1, pp. 399 - 403
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
A near-field scanning microwave microprobe (NSMM) technique has been used to investigate the magnetic properties of the Permalloy (Ni81Fe 19) thin film. To characterize the hysteresis behavior of the magnetoresistance (MR) of Permalloy (Py) thin films, the microwave reflection coefficient, S11 was measured. The change of the estimated MR was observed under in-plane external magnetic fields, and was confirmed with variation of MR measured by the 4-probe method. The magnetic properties of the Py thin film were examined by a vibrating sample magnetometer. The observed MR was correlated with the changes of the relative magnetic permeability, Δμ of the Py. We also directly imaged the Py thin film changes by NSMM. MR of Py was determined from the visualized microwave reflection coefficient changes ΔS11 at the thin film interface with high sensitivity. The present methodology can be extended to investigations of other magnetic thin films or magnetic materials using the NSMM system. © 2010 Elsevier B.V. All rights reserved.
DOI
10.1016/j.tsf.2010.07.024
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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