Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 최병주 | * |
dc.contributor.author | 윤회진 | * |
dc.date.accessioned | 2016-08-28T11:08:51Z | - |
dc.date.available | 2016-08-28T11:08:51Z | - |
dc.date.issued | 2005 | * |
dc.identifier.issn | 0302-9743 | * |
dc.identifier.other | OAK-2699 | * |
dc.identifier.uri | https://dspace.ewha.ac.kr/handle/2015.oak/219558 | - |
dc.description.abstract | CBSD needs to customize and compose components. Customization and composition can cause faults which are hard to detect by existing testing techniques, since components have different structures from traditional programs. This paper proposes a testing technique for customization and composition, and then it tailors the technique to COM component architecture. Since CBSD aims to reduce development cost, testing should consider the cost of testing. Effective test data will help reduce testing cost. Therefore, an empirical study shows that the technique proposed in this paper selects effective test data. © Springer-Verlag Berlin Heidelberg 2005. | * |
dc.language | English | * |
dc.title | Testing COM components using software fault injection and mutation analysis, and its empirical study | * |
dc.type | Conference Paper | * |
dc.relation.volume | 3395 | * |
dc.relation.index | SCOPUS | * |
dc.relation.startpage | 210 | * |
dc.relation.lastpage | 224 | * |
dc.relation.journaltitle | Lecture Notes in Computer Science | * |
dc.identifier.wosid | WOS:000228719900015 | * |
dc.identifier.scopusid | 2-s2.0-24144444710 | * |
dc.author.google | Yoon H. | * |
dc.author.google | Kim E. | * |
dc.author.google | Seo J.Y. | * |
dc.author.google | Choi B. | * |
dc.contributor.scopusid | 최병주(7402755545) | * |
dc.date.modifydate | 20240322133149 | * |