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Characterizing Memory References for Smartphone Applications and Its Implications

Title
Characterizing Memory References for Smartphone Applications and Its Implications
Authors
Lee, SoyoonBahn, Hyokyung
Ewha Authors
반효경
SCOPUS Author ID
반효경scopus
Issue Date
2015
Journal Title
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
ISSN
1598-1657JCR Link2233-4866JCR Link
Citation
vol. 15, no. 2, pp. 223 - 231
Keywords
SmartphoneNVMwrite referencestemporal localityZipf-like distribution
Publisher
IEEK PUBLICATION CENTER
Indexed
SCIE; SCOPUS; KCI WOS scopus
Abstract
As smartphones support a variety of applications and their memory demand keeps increasing, the design of an efficient memory management policy is becoming increasingly important. Meanwhile, as nonvolatile memory (NVM) technologies such as PCM and STT-MRAM have emerged as new memory media of smartphones, characterizing memory references for NVM-based smartphone memory systems is needed. For the deep understanding of memory access features in smartphones, this paper performs comprehensive analysis of memory references for various smartphone applications. We first analyze the temporal locality and frequency of memory reference behaviors to quantify the effects of the two properties with respect to the re-reference likelihood of pages. We also analyze the skewed popularity of memory references and model it as a Zipf-like distribution. We expect that the result of this study will be a good guidance to design an efficient memory management policy for future smartphones.
DOI
10.5573/JSTS.2015.15.2.223
Appears in Collections:
엘텍공과대학 > 컴퓨터공학과 > Journal papers
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