View : 18 Download: 0

Ultra-large current transport in thick SmBa2Cu3O7-x films grown by reactive co-evaporation

Title
Ultra-large current transport in thick SmBa2Cu3O7-x films grown by reactive co-evaporation
Authors
Kim, G.Jin, H. J.Jo, W.Nam, D. H.Cheong, H.Kim, H. S.Oh, S. S.Ko, R. K.Jo, Y. S.Ha, D. W.
Ewha Authors
조윌렴
SCOPUS Author ID
조윌렴scopus
Issue Date
2015
Journal Title
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS
ISSN
0921-4534JCR Link1873-2143JCR Link
Citation
vol. 513, pp. 29 - 34
Keywords
SmBCO coated conductorRoom-temperature thermoelectric microscopyLow temperature optical scanning microscopyMicro-Raman scattering spectroscopyDissipative current distribution
Publisher
ELSEVIER SCIENCE BV
Indexed
SCI; SCIE; SCOPUS WOS scopus
Abstract
Structural and transport properties of high performance SmBa2Cu3O7-x coated conductors produced by a dual-chamber co-evaporation are presented. The 5 mu m-thick SmBCO coated conductors grown on IBAD-MgO based Hastelloy metal templates show critical currents larger than 1020-1560 A/cm at 77 K and self-field. The current transport characteristics of the conductors are investigated by room-temperature thermoelectric microscopy and low-temperature bolometric microscopy. The local thermoelectric images show the tilted grains, grain boundaries, and microstructural defects on the surface of the coated conductors. The bias current-dependent bolometric response at low temperature displays the current of the local flux flow dissipation as an increasing bias. Furthermore, we measured micro-Raman scattering microscopic imaging on oxygen-related peaks of the conductors. Comparing the Raman signal images with the low temperature optical scanning maps, it is remarkable that the structural disorders represented by oxygen-related Raman peaks are closely related to the low temperature bolometric abnormalities. From this result, a nature of the dissipative current distribution in coated conductors is revealed. The scanning optical microscopic study will provide a promising method for quality assurance of coated conductors. (C) 2015 Elsevier B.V. All rights reserved.
DOI
10.1016/j.physc.2015.03.019
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE