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Indirect probing of defects in unipolar resistive switching NiOx thin films by Ni K-edge resonant inelastic X-ray scattering

Title
Indirect probing of defects in unipolar resistive switching NiOx thin films by Ni K-edge resonant inelastic X-ray scattering
Authors
Jung, RanjuPhark, Soo-HyonKim, Dong-WookUpton, MaryCasa, DiegoGog, ThomasKim, Jungho
Ewha Authors
김동욱박수현
SCOPUS Author ID
김동욱scopus
Issue Date
2015
Journal Title
APPLIED PHYSICS EXPRESS
ISSN
1882-0778JCR Link1882-0786JCR Link
Citation
vol. 8, no. 2
Publisher
IOP PUBLISHING LTD
Indexed
SCI; SCIE; SCOPUS WOS
Abstract
We present observations of the Ni K-edge resonant inelastic X-ray scattering (RIXS) in NiOx thin films showing unipolar resistive switching (RS). The RIXS spectra of RS NiOx thin films can be described in terms of crystal field (dd) and charge transfer (CT) excitations. We found distorted dd excitations in the films' pristine state before electroforming, and identical excitations for high and low resistance states after electroforming. This suggests that the RS property of NiOx thin film is related to defects in pristine NiOx films, and RS occurs in local nanosized spots too small to be detected by RIXS. (C) 2015 The Japan Society of Applied Physics
DOI
10.7567/APEX.8.021101
Appears in Collections:
자연과학대학 > 물리학전공 > Journal papers
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