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The risk of insulin resistance syndrome and oxidative stress before the postnatal catch-up growth
- The risk of insulin resistance syndrome and oxidative stress before the postnatal catch-up growth
- Min, J. W.; Park, B. H.; Kim, Y. J.; Ha, E-H; Lee, H. Y.; Park, E. A.; Hwang, Y. S.; Lim, H. S.; Park, H.
- Ewha Authors
- SCOPUS Author ID
- Issue Date
- Journal Title
- AMERICAN JOURNAL OF EPIDEMIOLOGY
- AMERICAN JOURNAL OF EPIDEMIOLOGY vol. 167, no. 11, pp. S17 - S17
- OXFORD UNIV PRESS INC
- SCI; SCIE; SCOPUS
- Document Type
- Meeting Abstract
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- 의과대학 > 의학과 > Journal papers
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