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Showing results 1 to 3 of 3

Issue DateTitleAuthor(s)Type
2020Deep Learning Based Defect Inspection Using the Intersection Over Minimum Between Search and Abnormal Regions김정태Article
2019Machine Learning-Based Fast Banknote Serial Number Recognition Using Knowledge Distillation and Bayesian Optimization김정태Article
2023Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules김정태Article
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