Showing results 7 to 8 of 8
Issue Date | Title | Author(s) | Type |
---|---|---|---|
2023 | Deep Neural Networks for Determining Subgap States of Oxide Thin-Film Transistors | 신형순; 박지선 | Article |
2021 | New Simulation Method for Dependency of Device Degradation on Bending Direction and Channel Length | 신형순; 박지선 | Article |