Showing results 2 to 3 of 3
Issue Date | Title | Author(s) | Type |
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2023 | Robust Inspection of Integrated Circuit Substrates Based on Twin Network With Image Transform and Suppression Modules | 김정태 | Article |
2023 | Spatial and Channel-Wise Co-Attention-Based Twin Network System for Inspecting Integrated Circuit Substrate | 김정태 | Article |